To remove the effects of vignetting and exposure time fluctuations we corrected each surface brightness profile by an observation specific normalized radial exposure profile. We began by extracting surface brightness profiles from the 0.7-2.0 keV energy range using concentric annular bins of size 5" (~10 ACIS pixels) originating from the X-ray center. As prescribed by Markevitch's cookbook, ACIS front-illuminated (FI) chips were analyzed in the 0.3-12.0 keV range with time bins of 259.28 sec in length, and for the ACIS back-illuminated (BI) chips, 2.5-7.0 keV energy range with time bins of 1037.12 sec. Periods with count rates >= 3sigma and/or a factor >= 1.2 of the mean background level of the observation were removed from the GTI file. To check for contamination from background flares or periods of excessively high background, light curve analysis was performed using Maxim Markevitch's contributed CIAO script lc_clean.sl. Both frames have the same scaling and are matched using WCS coordinates to an astrometric accuracy of less than 0.25 of a Chandra pixel (~0.12"). The SDSS image is logarithmically scaled and not smoothed. Same as the previous two images except the corresponding field in SDSS is shown at right. Smoothed X-ray image of cluster along with SDSS image Same as the wide-field image above but the binning factor used here was 2. Smoothed and binned Chandra X-ray image of the cluster "core" This image was produced using SAOImage DS9, developed by the Smithsonian Astrophysical Observatory. Point sources have not been excluded and no exposure correction has been applied to this image. Smoothed and binnd wide-field Chandra X-ray image of clusterĪ gaussian smoothing kernel with size 2 was applied to the flare-cleaned, level-2 events file binned with a factor of 8 to produce this image. Download the master table of profiles for this cluster.
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